BIRD 210 TEST BENCHPRECISION TESTING FOR MODERN ELECTRO-OPTICS DETECTORS
The BIRD 210 is a versatile and electro-optical test bench engineered to evaluate all types of detectors, particularly CMOS-based systems. It integrates ultra-low noise electronics with high-precision optical stimuli to deliver accurate and repeatable test results.
The BIRD 210 Test Bench offers a complete solution for evaluating detector performance with an intuitive interface, low-noise electronics, and motorized control of optical components. Ideal for laboratories and R&D environments requiring high-accuracy data on detector characteristics.
BIRD 210 TEST BENCHPRECISION TESTING FOR MODERN ELECTRO-OPTICS DETECTORS
The BIRD 210 is a versatile and electro-optical test bench engineered to evaluate all types of detectors, particularly CMOS-based systems. It integrates ultra-low noise electronics with high-precision optical stimuli to deliver accurate and repeatable test results.
The BIRD 210 Test Bench offers a complete solution for evaluating detector performance with an intuitive interface, low-noise electronics, and motorized control of optical components. Ideal for laboratories and R&D environments requiring high-accuracy data on detector characteristics.
MAIN BENEFITS
UNIVERSAL COMPATIBILITY
Test virtually any CMOS or similar detector architecture
SIMPLIFIED CONFIGURATION
Full control over pixel mapping, signal timing, and test settings
REPEATABLE & REPRODUCIBLE RESULTS
Consistent testing under precise optical and electrical conditions
FLEXIBLE TEST CRITERIA
Define thresholds for bad pixel mapping, spectral bands, temperature ranges, and more
OPTIMIZED PERFORMANCE TESTING
Adjust bias voltages in real time for best responsivity and minimal noise
COMPLETE DATA MANAGEMENT
Record and export results for analysis, traceability, and reporting
Available options and accessories
- Stabilized Blackbody sources – For high-precision NETD and non-uniformity testing
- Signal interface modules – Adaptable to various detector types and interfaces
- INFRATEST Software Suite – Advanced configuration, acquisition, and test result reporting
KEY FEATURES
ULTRA-LOW NOISE ELECTRONICS
Includes clock signal generator bias voltage control and high-frequency A/D converter
CALIBRATED OPTICAL STIMULI
Uniform IR blackbody for NETD and other noise testing
COMPLETE DETECTOR INTERFACE
Easily define and apply custom clock, bias voltages, and A/D parameters
REAL-TIME ACQUISITION
Optimizes detector settings with feedback on noise and responsivity
INTEGRATED INFRATEST TEST SOFTWARE
Visualize, record, and analyze all results from a central platform
Main applications of the BIRD 210 Test Bench
- Noise tests: fixed pattern noise, temporal noise, NETD, responsivity, detectivity, 3D-noise, 2D-detectivity
- Dynamic range, linearity
- Non-uniformity correction
- Bad pixel localisation
- Spectral response
Interested ? Get in touch !
Looking for a high-precision platform for CMOS and other electro-optical detector testing? Contact us to learn more about how the BIRD 210 can meet your testing and R&D requirements.
References
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